Performance evaluation involving multiple parameters in Built-In-Test systems

The Built-In-Test (BIT) system is an integrated subsystem for the determination of the health status of any primary system. The BIT consists of the hardware and software installations directed at performance of the functions of fault detection, diagnosis and isolation, as well as primary system record failure information. Evaluation of the definitions appropriate to the BIT system, including system characteristics and parameters, is important to an understanding of system functions. The object of this paper is to present general definitions of the BIT diagnosis parameters and a semiquantitative evaluation method for BIT systems. Finally, two case studies for actual problem solutions are included. [In Korean.]