| Article ID: | iaor2003820 |
| Country: | China |
| Volume: | 23 |
| Issue: | 8 |
| Start Page Number: | 7 |
| End Page Number: | 11 |
| Publication Date: | Aug 2001 |
| Journal: | Journal of Systems Engineering and Electronics |
| Authors: | Ma Zhanxin, Dai Yangshan, Ren Huixia |
| Keywords: | quality & reliability, risk |
On the basis of the data envelopment analysis method, concepts of maximum risk surface and minimum risk surface are provided. At the same time, a quantitative analysis methodology under multiple risk is given. In fact, the risk level of a decision making unit can be analyzed by this method, the maximum risk level many be found and the minimum risk level can be forecast using the two surfaces.