Part dispatch in random yield multistage flexible test systems for printed circuit boards

Part dispatch in random yield multistage flexible test systems for printed circuit boards

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Article ID: iaor1993447
Country: United States
Volume: 40
Issue: 4
Start Page Number: 776
End Page Number: 789
Publication Date: Jul 1992
Journal: Operations Research
Authors: , ,
Keywords: programming: dynamic, manufacturing industries
Abstract:

This paper concerns dynamic part dispatch decisions in electronic test systems with random yield. A discrete time, multiproduct, multistage production system is used as a model for the test system with the objective to minimize the sum of inventory holding, backlogging, and overtime costs over a finite horizon. Exact results for such systems have been limited to either single-stage, multiple time period, or multistage, single time period problems with a single product. Here the authors develop two approximate policies: the linear decision rule, and the myopic resource allocation. The effectiveness of the two policies is evaluated through simulation under different operating conditions representative of those encountered in IBM and Tandem Computer facilities. The extensive computational study clearly demonstrates the overall superiority of the linear decision rule.

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