Topological defects in the pattern process of ecological systems

Topological defects in the pattern process of ecological systems

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Article ID: iaor19921470
Country: Japan
Volume: 38
Start Page Number: 201
End Page Number: 211
Publication Date: Nov 1991
Journal: Proceedings of the Institute of Statistical Mathematics
Authors:
Keywords: simulation, ecology
Abstract:

By stochastic simulation, the spatial pattern in the lattice system composed of three species is studied. An individual is assumed to react with a neighbour. This model corresponds to the lattice version of the Lotka-Volterra model. Topological defects are introduced to explain the pattern formation in this system. Since the number of topological defects is much less than that of individuals, the pattern process of the system is very simplified. [In Japanese.]

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