Article ID: | iaor2009199 |
Country: | United Kingdom |
Volume: | 46 |
Issue: | 3 |
Start Page Number: | 739 |
End Page Number: | 752 |
Publication Date: | Jan 2008 |
Journal: | International Journal of Production Research |
Authors: | Zhang M. Tao, Fu J., Zhu E. |
Keywords: | programming: constraints |
It is very challenging to gain a competitive advantage in semiconductor assembly manufacturing, mainly due to widely and quickly fluctuating customer requests, complicated workflows, and the co-existence of new and aging technology/equipment. In late 2003, Intel Shanghai experienced capacity degradation, mainly due to the introduction of multiple-chip products with re-entrant workflows. In response, we applied the joint protective capacity methodology to semiconductor assembly manufacturing and developed a dynamic capacity model that captures the variability of re-entrant manufacturing systems.