Dynamic capacity modeling in semiconductor assembly manufacturing

Dynamic capacity modeling in semiconductor assembly manufacturing

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Article ID: iaor2009199
Country: United Kingdom
Volume: 46
Issue: 3
Start Page Number: 739
End Page Number: 752
Publication Date: Jan 2008
Journal: International Journal of Production Research
Authors: , ,
Keywords: programming: constraints
Abstract:

It is very challenging to gain a competitive advantage in semiconductor assembly manufacturing, mainly due to widely and quickly fluctuating customer requests, complicated workflows, and the co-existence of new and aging technology/equipment. In late 2003, Intel Shanghai experienced capacity degradation, mainly due to the introduction of multiple-chip products with re-entrant workflows. In response, we applied the joint protective capacity methodology to semiconductor assembly manufacturing and developed a dynamic capacity model that captures the variability of re-entrant manufacturing systems.

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