The α-reliable mean-excess regret model for stochastic facility location modeling

The α-reliable mean-excess regret model for stochastic facility location modeling

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Article ID: iaor20072763
Country: United States
Volume: 53
Issue: 7
Start Page Number: 617
End Page Number: 626
Publication Date: Oct 2006
Journal: Naval Research Logistics
Authors: , , ,
Keywords: risk
Abstract:

In this paper, we study a strategic facility location problem under uncertainty. The uncertainty associated with future events is modeled by defining alternative future scenarios with probabilities. We present a new model called the α-reliable mean-excess model that minimizes the expected regret with respect to an endogenously selected subset of worst-case scenarios whose collective probability of occurrence is no more than 1 – α. Our mean-excess risk measure is coherent and computationally efficient. Computational experiments also show that the α-reliable mean-excess criterion matches the α-reliable minimax criterion closely.

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