Article ID: | iaor20043583 |
Country: | United Kingdom |
Volume: | 42 |
Issue: | 1 |
Start Page Number: | 79 |
End Page Number: | 99 |
Publication Date: | Jan 2004 |
Journal: | International Journal of Production Research |
Authors: | Lin J.T., Wang Fu-Kwun, Lee W.T. |
Keywords: | simulation: applications |
A capacity-constrained scheduling using the concept of the theory of constraints for a semiconductor Logic IC final test operation is presented. The scheduling of the IC final test considers unrelated parallel machines with multiple constraint problems. A broad product mix, variable lot sizes and yields, long and variable set-up times, as well as limited test equipment capacity characterize the operations in this test facility. Discrete event simulation models based on