Bayesian burn-in procedures for limited failure populations

Bayesian burn-in procedures for limited failure populations

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Article ID: iaor2003174
Country: United Kingdom
Volume: 40
Issue: 11
Start Page Number: 2547
End Page Number: 2555
Publication Date: Jan 2002
Journal: International Journal of Production Research
Authors: ,
Abstract:

Bayesian burn-in procedures are developed for limited failure populations in which defective items fail soon after they are put into operation and non-defective ones never fail during the technological life of the items. Sequential schemes guaranteeing the prescribed quality of a product are derived based on prior information on the quality of a product and accumulated failure information up to the decision point. Numerical examples are provided.

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