Article ID: | iaor2003174 |
Country: | United Kingdom |
Volume: | 40 |
Issue: | 11 |
Start Page Number: | 2547 |
End Page Number: | 2555 |
Publication Date: | Jan 2002 |
Journal: | International Journal of Production Research |
Authors: | Keats J. Bert, Kwon Young Il |
Bayesian burn-in procedures are developed for limited failure populations in which defective items fail soon after they are put into operation and non-defective ones never fail during the technological life of the items. Sequential schemes guaranteeing the prescribed quality of a product are derived based on prior information on the quality of a product and accumulated failure information up to the decision point. Numerical examples are provided.