Article ID: | iaor20012764 |
Country: | United Kingdom |
Volume: | 38 |
Issue: | 18 |
Start Page Number: | 4743 |
End Page Number: | 4761 |
Publication Date: | Jan 2000 |
Journal: | International Journal of Production Research |
Authors: | Berry William L., Leong G. Keong, Schilling David A., Hill James A. |
Keywords: | production: MRP |
Traditional approaches to planning and control of manufacturing (MRPII) focus on discrete parts manufacturing industries (e.g. automotive). The chemical industry, however, presents unique challenges. Cross-contamination of production is a key issue among some chemical facilities. A considerable amount of capacity is lost as a result of changeovers which involve performing thorough clean-ups to wash away the impurities which may contaminate the next product to be produced. Therefore, planning for sequence-dependent changeovers becomes crucial and complicates the master production scheduling process. This paper shows how improved master production scheduling performance can be obtained by using a two-level master production schedule (MPS) to focus on key plant processes, and by incorporating a scheduling heuristic which considers sequence-dependent changeovers and capacity constraints. This approach is illustrated using actual operating data from a chemical firm typical of many process industry operations. Simulation experiments are reported that test the performance of the proposed master scheduling method in a single-stage sequence-dependent process. The experimental factors include both the introduction of the two-level MPS with the scheduling heuristic, and the effect of changes in the MPS batch size. The results demonstrate that important simultaneous improvements in process changeover time and delivery performance can be achieved using the proposed MPS scheduling approach against a more traditional (single-level) MPS approach which does not consider sequence-dependent changeovers. Further, we find that delivery performance is relatively insensitive to adjustments in the MPS batch size when using the two-level MPS approach.