Sequential inspection under capacity constraints

Sequential inspection under capacity constraints

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Article ID: iaor2001603
Country: United States
Volume: 47
Issue: 3
Start Page Number: 410
End Page Number: 421
Publication Date: May 1999
Journal: Operations Research
Authors: ,
Keywords: programming: linear, probability, programming: dynamic
Abstract:

We study the inspection process in the context of multistage batch manufacturing, focusing on interstage coordination under capacity limits. The problem is formulated as a constrained Markov decision program. We establish the optimality of a sequential policy that is characterized by a sequence of thresholds, with certain randomization at the thresholds. We further show that such an optimal policy can be completely derived through solving a linear program, and that randomization is needed at no more than two threshold values. We discuss an application in semiconductor wafer fabrication, which motivates our study.

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