Effects of simulated annealing in the resonant-tunneling resistive-fuse network for early vision

Effects of simulated annealing in the resonant-tunneling resistive-fuse network for early vision

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Article ID: iaor19972513
Country: Japan
Volume: E79-C
Issue: 11
Start Page Number: 1543
End Page Number: 1549
Publication Date: Nov 1996
Journal: Transactions of the Institute of Electronics, Information and Communication Engineers
Authors:
Keywords: numerical analysis, networks
Abstract:

The resistive-fuse network for early vision was studied using circuit simulation to clarify the potential of implementation with resonant tunneling diodes (RTDs). To overcome the fundamental problem of the RTD network, i.e., the RTDs cannot perform simulated annealing, pseudo-annealing was proposed. These methods are based on the time-variation of the input signal strength, and are found to be effective in restoring images. A resistive-fuse network is shown to be one of the most promising applications of RTDs.

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