A model for determining optimal quantity in a semiconductor production line considering yield randomness and demand uncertainty

In this paper, the authors have developed a model to determine the input quantity to be processed at each stage of a multi-stage production system in which the yield at each stage may be random and may need reworking at that stage. Yield randomness, especially in a semi-conductor industry, is a most challenging problem for production control. The demand for final product is uncertain. The authors have extended the model proposed in Park and Kim to consider a multiple number of reworkings which can be done at any stage prior to or at the stage where output is bad, depending on the level of the defect. [In Korean.]