A multiple objective approach for constructing attribute-sampling plans for non-serial assembly items

A number of methods exist for determining fraction-defective sampling plans for single items. However, most methods currently exist for determining a set of optimal sampling plans for serial assembly processes. This paper develops a risk and cost-based model which explicitly considers the effect of the quality of lower level items on the quality of the final product. The model allows a minimum cost set of sampling plans to be determined for all items in a multi-level, non-serial product. The authors study the performance of the model with an algorithm for solving nonlinear, multiple-criteria formulations.