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Y T Tai
Information about the author Y T Tai will soon be added to the site.
Found
2 papers
in total
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Capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk
2011
Process capability index C pk is the most popular capability index widely used in the...
Fast and effective algorithms for the liquid crystal display module (LCM) scheduling problem with sequence-dependent setup time
2009
The liquid crystal display module scheduling problem (LCMSP) is a variation of the...
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