Optimum simple step-stress accelerated life tests for Weibull distribution and Type I censoring

This article presents an optimum simple step-stress accelerated life test for the Weibull distribution under Type I censoring. It is assumed that a log-linear relationship exists between the Weibull scale parameter and the (possibly transformed) stress and that a certain cumulative exposure model for the effect of changing stress holds. The optimum plan-low stress and stress change time-is obtained, which minimizes the asymptotic variance of the maximum likelihood estimator of a stated percentile at design stress. For selected values of the design parameters, nomographs useful for finding the optimum plan are given, and the effects of errors in preestimates of the parameters are investigated. As an alternative to the simple step-stress test, a three-level compromise plan is proposed, and its performance is studied and compared with that of the optimum simple step-stress test.