Utilizing Accelerated Degradation and Field Data for Life Prediction of Highly Reliable Products

For newly developed, highly reliable, and long‐lifespan products, it is quite difficult to implement effective remaining useful life (RUL) prediction in the early usage under limited time cost. However, accelerated degradation testing (ADT) is generally used for lifetime evaluation for such products with harsher test conditions and shorter test time in the late research and development phase. Thus, in this paper, we propose a life prediction framework to integrate the information from ADT to conduct field RUL prediction for highly reliable products. Because ADT belongs to reliability testing used for inferring the population information from the selected test samples, we at first present the modified Wiener process (MWP) model. Different from traditional methods that embody both the random variability and unit‐to‐unit variability into the diffusion coefficient, the proposed method describes them separately in ADT analysis. Then, the MWP model from ADT is used as a prior for field RUL prediction of the target product during which the strong tracking filtering algorithm is introduced for updating the hidden state and computing the RUL prediction results when the new monitoring data are available. Because of the complexity of the MWP model, the Markov chain Monte Carlo method is provided to estimate the unknown parameters. Finally, the simulation study and the light‐emitting diode application verify the effectiveness of the proposed framework that can achieve reasonable life prediction results for highly reliable products for both linear and nonlinear scenarios.