Accelerated Life Testing (ALT) Design Based on Computational Reliability Analysis

Accelerated life testing (ALT) design is usually performed based on assumptions of life distributions, stress–life relationship, and empirical reliability models. Time‐dependent reliability analysis on the other hand seeks to predict product and system life distribution based on physics‐informed simulation models. This paper proposes an ALT design framework that takes advantages of both types of analyses. For a given testing plan, the corresponding life distributions under different stress levels are estimated based on time‐dependent reliability analysis. Because both aleatory and epistemic uncertainty sources are involved in the reliability analysis, ALT data is used in this paper to update the epistemic uncertainty using Bayesian statistics. The variance of reliability estimation at the nominal stress level is then estimated based on the updated time‐dependent reliability analysis model. A design optimization model is formulated to minimize the overall expected testing cost with constraint on confidence of variance of the reliability estimate. Computational effort for solving the optimization model is minimized in three directions: (i) efficient time‐dependent reliability analysis method; (ii) a surrogate model is constructed for time‐dependent reliability under different stress levels; and (iii) the ALT design optimization model is decoupled into a deterministic design optimization model and a probabilistic analysis model. A cantilever beam and a helicopter rotor hub are used to demonstrate the proposed method. The results show the effectiveness of the proposed ALT design optimization model.