Bayesian Control Chart for Nonconformities

The c‐chart or the control chart for nonconformities is designed for the case where one deals with the number of defects or nonconformities observed. A control chart can be developed for the total or average number of nonconformities per unit, which is well modeled by the Poisson distribution. In this paper the c‐chart will be studied, where the usual operation of the c‐chart will be extended by introducing a Bayesian approach for the c‐chart. Control chart limits, average run lengths, and false alarm rates will be determined by using a Bayesian method. These results will be compared with the results obtained when using the classical (frequentist) method.