Degradation-shock-based Reliability Models for Fault-tolerant Systems

Reliability modeling of fault‐tolerant systems subject to shocks and natural degradation is important yet difficult for engineers, because the two external stressors are often positively correlated. Motivated by the fact that most radiation‐induced failures are contributed from these two external stressors, a degradation‐shock‐based approach is proposed to model the failure process. The proposed model accommodates two kinds of failure modes: hard failure caused by shocks and soft failure caused by degradation. We consider a generalized m–δ shock model for systems with fault‐tolerant design: failure occurs if the time lag between m sequential shocks is less than δ hours or degradation crosses a critical threshold. An example concerning memory chips used in space is presented to demonstrate the applicability of the proposed model.