Article ID: | iaor201528929 |
Volume: | 31 |
Issue: | 6 |
Start Page Number: | 1053 |
End Page Number: | 1061 |
Publication Date: | Oct 2015 |
Journal: | Quality and Reliability Engineering International |
Authors: | Wang Fu-Kwun, Tamirat Yeneneh |
Keywords: | simulation |
In many industrial applications, the quality of a process or product can be characterized by a function or profile. Owing to spatial autocorrelation or time collapse, the assumption of the observations within each profile that are uncorrelated is violated. This paper aims at evaluating the process yield for linear within‐profile autocorrelation. We present an approximate lower confidence bound for S