Article ID: | iaor201523903 |
Volume: | 30 |
Issue: | 8 |
Start Page Number: | 1131 |
End Page Number: | 1144 |
Publication Date: | Dec 2014 |
Journal: | Quality and Reliability Engineering International |
Authors: | Huwang Longcheen, Wang Yi-Hua Tina, Shen Cheng-Che |
Keywords: | control, statistics: distributions, manufacturing industries |
We consider the quality of a process which can be characterized by a general linear profile where the random error has a contaminated normal distribution. On the basis of trimmed least squares estimation, new control charts for monitoring the coefficient parameters and/or the error variance of the profile are proposed. Simulation studies show that the proposed control charts outperform the existing competitors under such a profile. An example from manufacturing facility is used to illustrate the applicability of the proposed charts.