| Article ID: | iaor201523798 |
| Volume: | 30 |
| Issue: | 1 |
| Start Page Number: | 143 |
| End Page Number: | 156 |
| Publication Date: | Feb 2014 |
| Journal: | Quality and Reliability Engineering International |
| Authors: | Merle G, Roussel J -M, Lesage J -J |
| Keywords: | fault diagnosis |
This paper presents a probabilistic model of dynamic gates which allows to perform the quantitative analysis of any dynamic fault tree (DFT) from its structure function. Both these probabilistic models and the quantitative analysis which can be performed thanks to them can accommodate any failure distribution of basic events. We illustrate our approach on a DFT example from the literature.