Modeling of functional failures in digital systems under the radiation effect

In this paper we study modeling techniques for functional failures in digital systems under the radiation effect; these techniques are based on Brouwer’s model of a fuzzy digital automaton. In comparison with common approaches, a fundamental difference of such method lies in the feasibility of explicit consideration (in functional‐logical models) of the relationship between radiation resistance of integrated circuits (IC) and their mode of operation, functional state, engineering and schematic parameters. In addition, certain methods for constructing criterion membership functions are proposed for basic elements in different IC. Finally, the algorithms for forecasting transient and residual radiation effects in IC are developed.