Article ID: | iaor201112590 |
Volume: | 27 |
Issue: | 2 |
Start Page Number: | 203 |
End Page Number: | 208 |
Publication Date: | Mar 2011 |
Journal: | Quality and Reliability Engineering International |
Authors: | Wang Fu-Kwun, Chu Tao-Peng |
Keywords: | heuristics, statistics: distributions |
The calculation of mean time between failures is very important in reliability life data analysis. For different distributions, the values of mean time between failures are always different. The two-parameter Weibull distribution is widely used in reliability engineering. However, some distributions may offer a better fit of data. This paper aims to develop an algorithm for determining the best-fitted distribution of a liquid crystal display panel based on the field return data. The two-parameter and three-parameter Weibull distributions and other distributions such as the Burr XII distribution, the Pareto distribution and the Log-logistic distribution are compared to provide a better characterization of the life data which is based on the maximum value of all log-likelihood functions. We also provide a goodness-of-fit test for the best-fitted distribution. It is recommended that the Burr XII distribution could be used to characterize the reliability life of a liquid crystal display panel.