Designing on optimal life test with Type I censoring

The present study considers the design of an optimal life test plan with Type I censoring in the case where only one testing machine is available and a machine tests items sequentially as seen in fatigue life tests of metallic materials. Under the condition that the life test is conducted in a fixed censoring time and with a fixed number of test items, a method for determining the censoring time and the number of test items is proposed from the Bayesian point of view. The proposed method is also applied to the Weibull life distribution with a known shape parameter.