Article ID: | iaor20052508 |
Country: | United States |
Volume: | 51 |
Issue: | 5 |
Start Page Number: | 704 |
End Page Number: | 719 |
Publication Date: | Aug 2004 |
Journal: | Naval Research Logistics |
Authors: | Kuo Way, Kim Kyungmee O. |
Keywords: | electronics industry |
The correlated improvement in yield and reliability has been observed in the case studies on integrated circuits and electronic assemblies. This paper presents a model that incorporates yield and reliability with the addition of a burn-in step to explain their correlated improvement. The proposed model includes as special cases several yield and reliability models that have been previously published and thus provides a unifying framework. The model is used to derive a condition for which yield functions can be multiplied to obtain the overall yield. Yield and reliability are compared as a function of operation time, and an analytical condition for burn-in to be effective is also obtained. Finally, Poisson and negative binomial defects models are further considered to investigate how reliability is based on yield.