A unified model incorporating yield, burn-in, and reliability

A unified model incorporating yield, burn-in, and reliability

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Article ID: iaor20052508
Country: United States
Volume: 51
Issue: 5
Start Page Number: 704
End Page Number: 719
Publication Date: Aug 2004
Journal: Naval Research Logistics
Authors: ,
Keywords: electronics industry
Abstract:

The correlated improvement in yield and reliability has been observed in the case studies on integrated circuits and electronic assemblies. This paper presents a model that incorporates yield and reliability with the addition of a burn-in step to explain their correlated improvement. The proposed model includes as special cases several yield and reliability models that have been previously published and thus provides a unifying framework. The model is used to derive a condition for which yield functions can be multiplied to obtain the overall yield. Yield and reliability are compared as a function of operation time, and an analytical condition for burn-in to be effective is also obtained. Finally, Poisson and negative binomial defects models are further considered to investigate how reliability is based on yield.

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