A computer-automated statistical process control method with timely response

A wide variety of metrology instruments can now interface with computers to acquire and process data on parts as they are produced. In addition to accept/reject actions, the instrument can provide information for statistical analysis. For Statistical Process Control (SPC), a variable in every part can be measured at production line speeds and the data can be used to generate points for control charts. The process control computer can then analyze the control chart (held in its memory and updated in realtime) to identify out-of-control conditions.