| Article ID: | iaor1991995 |
| Country: | Netherlands |
| Volume: | 18 |
| Issue: | 1 |
| Start Page Number: | 11 |
| End Page Number: | 21 |
| Publication Date: | Oct 1989 |
| Journal: | Engineering Costs and Production Economics |
| Authors: | Hungerford James F. |
This paper provides an analysis of the variables that affect the cost of test and repair in electronics manufacturing. Numeric data presented in this discussion were generated using ‘Test Process Modeling’, A technique that employs mathematical models to explain the relationship of manufacturing and test variables to product quality, test cost, and return-on-investment in electronics manufacturing.