| Article ID: | iaor2004517 |
| Country: | Netherlands |
| Volume: | 34 |
| Issue: | 5/6 |
| Start Page Number: | 593 |
| End Page Number: | 602 |
| Publication Date: | Sep 2001 |
| Journal: | Mathematical and Computer Modelling |
| Authors: | Cong Shan, Hong Lang |
| Keywords: | stochastic processes |
This paper presents a new set of models which utilize the target information implied by more than two scans of measurements. The new models are called interval models. Simulations prove that interval models have significant advantages over existing models in certain common scenarios.