Integrated facilities design using a contour distance metric

Integrated facilities design using a contour distance metric

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Article ID: iaor20022100
Country: United States
Volume: 33
Issue: 4
Start Page Number: 337
End Page Number: 344
Publication Date: Apr 2001
Journal: IIE Transactions
Authors: , ,
Keywords: design
Abstract:

The unequal area facility design problem has been studied in the literature generally by considering block layout separate from detailed design. This paper shows a tractable method for concurrently optimizing department shape and location within the facility, and selection of the appropriate number of Input/Output (I/O) stations per department and then optimally locating them. The distance metric used is the contour distance that measures transport between I/O stations along the perimeters of departmental boundaries. This distance metric better reflects allowable material flow for many industrial applications and it directly implies the optimal aisle structure for the facility.

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