Two phase heuristic for test set generation using simulated annealing in cyber testbank system

Two phase heuristic for test set generation using simulated annealing in cyber testbank system

0.00 Avg rating0 Votes
Article ID: iaor20021456
Country: South Korea
Volume: 18
Issue: 1
Start Page Number: 155
End Page Number: 164
Publication Date: May 2001
Journal: Korean Management Science Review
Authors:
Keywords: education
Abstract:

The widespread diffusion of Internet has enabled every college and education institute to develop cyber education systems to meet the multiple needs of students, but it is not true that the effectiveness of cyber education is fruitful in terms of evaluation systems. Most of the early developed web-based evaluation systems for cyber education require that all the students should solve a uniform test set which is included in the predetermined static HTML pages. Therefore, it is impossible to dynamically provide a test set with consistency and reliability. This paper describes the employment of simulated annealing in cyber testbank system for test set generation that satisfies all constraints. The constraints include number of items for each skill, method, domain, topic, and so on. This research developed two phase heuristic combining sequential test set generation algorithm with simulated annealing. As a result of computer simulations, it was found that the two phase heuristic outperforms the other algorithms.

Reviews

Required fields are marked *. Your email address will not be published.