Integrated design of run-to-run PID controller and statistical process control monitoring for process disturbance rejection

Integrated design of run-to-run PID controller and statistical process control monitoring for process disturbance rejection

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Article ID: iaor20021324
Country: United States
Volume: 31
Issue: 6
Start Page Number: 517
End Page Number: 527
Publication Date: Jun 1999
Journal: IIE Transactions
Authors: ,
Abstract:

An integrated design methodology has been developed for a run-to-run PID controller and SPC monitoring for the purpose of process disturbance rejection. In the paper, the process disturbance is assumed to be an ARMA (1, 1) process. A detailed procedure is developed to design a PID controller which minimizes process variability. The performance of the PID controller is also discussed. A joint monitoring of input and output, using Bonferroni's approach, is then designed for the controlled process. The ARL performance is studied. One major contribution of the paper is to develop a complete procedure and design plots, which serve as tools to conduct all the aforementioned tasks. An example is provided to illustrate the integrated design approach.

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