Article ID: | iaor1990633 |
Country: | Israel |
Volume: | 26 |
Issue: | 4 |
Start Page Number: | 1 |
End Page Number: | 7 |
Publication Date: | Dec 1989 |
Journal: | Journal of Applied Probability |
Authors: | Karasu Izi, zekici Sleyman. |
Consider a device that deteriorates in time according to an increasing Markov process so that it fails as soon as a critical threshold is exceeded. NBUE and NWUE properties of the lifetime of the device are identified to extend the existing literature on the PF