A hierarchical queueing network model of a large electronics test facility

This paper presents a hierarchical queueing network model for the steady-state performance evaluation of a large, automated electronics test facility. The model is nonstandard (i.e., nonproduct-form) and is characterized by hundreds of types of units to be tested (customer classes), hundreds of resource types (multi-server network nodes) with simultaneous resource possession, class-dependent service times, and a first-come first-served (FCFS) discipline at each node. A novel feature of the present analysis technique is a three-level iterative algorithm that exploits the inherent testing activity decomposition among the personnel and hardware resource nodes of the network. The model is currently in use as part of a larger optimization-based decision support system for the analysis and synthesis of electronics test facilities.