Optimal design of accelerated life tests under periodic inspection

For the exponentially distributed lifetimes, optimal accelerated life test plans are determined under the assumptions of periodic inspection and Type I censoring. Computational results indicate that for the range of parameter values considered the asymptotic variance of the estimated mean or pth quantile at the use stress is not sensitive to the number of inspections at overstress levels. Sensitivity analyses are also conducted to see how sensitive the asymptotic variance of the estimated mean is with respect to the uncertainties involved in the guessed failure probabilities at the use and high stress levels. Computational results show that moderate deviations (several tens of percents) of the guessed failure probabilities from their true values are fairly tolerable in terms of the relative amount of increase in the asymptotic variance of the estimated mean. Procedures for selecting a sample size and for determining whether or not to conduct an accelerated life test are also discussed.