Design of sequential sampling inspection plans with screening based on minimal lattice paths

Design of sequential sampling inspection plans with screening based on minimal lattice paths

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Article ID: iaor1995927
Country: United States
Volume: 41
Issue: 7
Start Page Number: 991
End Page Number: 1005
Publication Date: Dec 1994
Journal: Naval Research Logistics
Authors: ,
Abstract:

In this article the authors propose new sequential sampling inspection plans with screening indexed by LTPD and AOQL, in which the alternative of accepting or rejecting a lot is decided by the results of sequential sampling plans, based on the minimal lattice paths. It is illustrated that the average total inspection can be economized by using both of the proposed sequential sampling inspection plans, with screening indexed by LTPD and AOQL, respectively.

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