| Article ID: | iaor19942197 |
| Country: | United States |
| Volume: | 41 |
| Issue: | 4 |
| Start Page Number: | 523 |
| End Page Number: | 535 |
| Publication Date: | Jun 1994 |
| Journal: | Naval Research Logistics |
| Authors: | Bai D.S., Kwon Y.I. |
An economic sequential screening procedure is considered for limited failure populations in which defective items fail soon after they are put in operation and nondefective ones never fail during the technical life of the items. A cost model is constructed that involves screening test cost and external failure cost. A sequential scheme that minimizes the expected cost is derived from the solution of a dynamic programming formulation and the optimal decision at each stage is obtained in a closed form.