Rodrguez-Picn Luis Alberto

Luis Alberto Rodrguez-Picn

Information about the author Luis Alberto Rodrguez-Picn will soon be added to the site.
Found 1 papers in total
Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution
2016
Degradation models have received much attention in the area of reliability estimation,...
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