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Arturo Del Valle
Information about the author Arturo Del Valle will soon be added to the site.
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2 papers
in total
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Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution
2016
Degradation models have received much attention in the area of reliability estimation,...
Reliability Model for Electronic Devices under Time Varying Voltage
2016
Present reliability models, which estimate the lifetime of electronic devices, work...
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